Python research code for defect-oriented automatic test pattern generation in silicon-photonic integrated circuits: Jacobian/SOCP search, nonlinear verification, and test-set compaction. Noncommercial research use; commercial use requires permission.
python gurobi atpg silicon-photonics defect-detection research-software design-for-test second-order-cone-programming photonic-integrated-circuits automatic-test-pattern-generation test-compaction
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Updated
Oct 7, 2026 - Python